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| Manufacturer Part Number: | 74HC164BQ,115 |
|---|---|
| Manufacturer: | NXP Semiconductors |
| Product Category: | Logic - Shift Registers |
| Available Quantity: | 18010 Pieces |
| Unit Price: | Quote by Email |
| Description: | IC SHIFT REGISTER 8BIT DHVQFN14 |
| Lead Free Status / RoHS Status: | Lead free / RoHS Compliant |
| Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
| Production Status (Lifecycle): | In Production |
| Delivery Time: | 1-2 Days |
| Date Code (D/C): | New |
| Datasheet Download: | 74HC164BQ,115 Datasheet |
| Internal Part Number | 898-74HC164BQ,115 | |
| Manufacturer Lead time | 6-8 weeks | |
| Condition | New & Unused, Original Sealed | |
| Product Training Modules | Logic Packages | |
| PCN Assembly/Origin | ICN6 to ICN8 Transfer 13/Jul/2013 | |
| PCN Packaging | Date Code Extended 18/Jul/2013 | |
| Online Catalog | 74HC | |
| Category | Integrated Circuits (ICs) | |
| Family | Logic - Shift Registers | |
| Manufacturer | NXP Semiconductors | |
| Series | 74HC | |
| Packaging | Tape & Reel (TR) | |
| Part Status | Active | |
| Logic Type | Shift Register | |
| Output Type | Push-Pull | |
| Number of Elements | 1 | |
| Number of Bits per Element | 8 | |
| Function | Serial to Parallel | |
| Voltage - Supply | 2 V ~ 6 V | |
| Operating Temperature | -40°C ~ 125°C | |
| Mounting Type | Surface Mount | |
| Package / Case | 14-VFQFN Exposed Pad | |
| Supplier Device Package | 14-DHVQFN (2.5x3) | |
| Standard Package | 3,000 | |
| Weight | 0.001 KG | |
| Application | Email for details | |
| Replacement Part | 74HC164BQ,115 | |
| Country of Origin | USA / JAPAN / Philippines / Malaysia | |
| MOQ | 1 Piece | |
| Picture / Image / Photo | Send via email | |
74HC164BQ,115 is in stock for immediate shipping now. We are the distributor of NXP Semiconductors all series components. The condition of 74HC164BQ,115 is new and unused, you can buy 74HC164BQ,115 NXP Semiconductors with us at a very low price and quick delivery.
Please kindly send us an email if you have any demands for 74HC164BQ,115.
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