Stocking distributor of Electronic Components

BUK7K25-40E,115

BUK7K25-40E,115
Manufacturer Part Number:BUK7K25-40E,115
Manufacturer:
Product Category:Transistors - FETs, MOSFETs - Arrays
Available Quantity:9010 Pieces
Unit Price:Quote by Email
Description:MOSFET 2N-CH 40V 27A LFPAK56D
Lead Free Status / RoHS Status:Lead free / RoHS Compliant
Moisture Sensitivity Level (MSL):1 (Unlimited)
Production Status (Lifecycle):In Production
Delivery Time:1-2 Days
Date Code (D/C):New
Datasheet Download: BUK7K25-40E,115 Datasheet
BUK7K25-40E,115´s Parameters
Internal Part Number898-BUK7K25-40E,115
Manufacturer Lead time6-8 weeks
ConditionNew & Unused, Original Sealed
PCN Assembly/OriginTrenchMOS Silicon Process 19/Sep/2014
TrenchMOS Silicon Process Revision 17/Jan/2015
PCN PackagingLeader/Trailer Update 03/Apr/2015
Lighter Reel Update 29/Aug/2015
Online Catalog N-Channel Standard FETs
CategoryDiscrete Semiconductor Products
FamilyTransistors - FETs, MOSFETs - Arrays
ManufacturerNXP Semiconductors
SeriesAutomotive, AEC-Q101, TrenchMOS™
PackagingTape & Reel (TR)
Part StatusActive
FET Type2 N-Channel (Dual)
FET FeatureStandard
Drain to Source Voltage (Vdss)40V
Current - Continuous Drain (Id) @ 25°C27A
Rds On (Max) @ Id, Vgs25 mOhm @ 5A, 10V
Vgs(th) (Max) @ Id4V @ 1mA
Gate Charge (Qg) @ Vgs7.9nC @ 10V
Input Capacitance (Ciss) @ Vds525pF @ 25V
Power - Max32W
Operating Temperature-55°C ~ 175°C (TJ)
Mounting TypeSurface Mount
Package / CaseSOT-1205, 8-LFPAK56
Supplier Device PackageLFPAK56D
Standard Package 1,500
Weight0.001 KG
ApplicationEmail for details
Replacement PartBUK7K25-40E,115
Country of OriginUSA / JAPAN / Philippines / Malaysia
MOQ1 Piece
Picture / Image / PhotoSend via email

BUK7K25-40E,115 is in stock for immediate shipping now. We are the distributor of NXP Semiconductors all series components. The condition of BUK7K25-40E,115 is new and unused, you can buy BUK7K25-40E,115 NXP Semiconductors with us at a very low price and quick delivery.

Please kindly send us an email if you have any demands for BUK7K25-40E,115.

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