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BUK7Y102-100B,115

BUK7Y102-100B,115
Manufacturer Part Number:BUK7Y102-100B,115
Manufacturer:
Product Category:Transistors - FETs, MOSFETs - Single
Available Quantity:10510 Pieces
Unit Price:Quote by Email
Description:MOSFET N-CH 100V 15A LFPAK
Lead Free Status / RoHS Status:Lead free / RoHS Compliant
Moisture Sensitivity Level (MSL):1 (Unlimited)
Production Status (Lifecycle):In Production
Delivery Time:1-2 Days
Date Code (D/C):New
Datasheet Download: BUK7Y102-100B,115 Datasheet
BUK7Y102-100B,115´s Parameters
Internal Part Number898-BUK7Y102-100B,115
Manufacturer Lead time6-8 weeks
ConditionNew & Unused, Original Sealed
PCN Design/SpecificationR0-Clip Overhang Removal 14/Apr/2014
R0-Clip Overhang Revision 14/Sep/2015
PCN PackagingLeader/Trailer Update 03/Apr/2015
Lighter Reel Update 29/Aug/2015
Online Catalog N-Channel Standard FETs
CategoryDiscrete Semiconductor Products
FamilyTransistors - FETs, MOSFETs - Single
ManufacturerNXP Semiconductors
SeriesAutomotive, AEC-Q101, TrenchMOS™
PackagingTape & Reel (TR)
Part StatusActive
FET TypeMOSFET N-Channel, Metal Oxide
FET FeatureStandard
Drain to Source Voltage (Vdss)100V
Current - Continuous Drain (Id) @ 25°C15A (Tc)
Rds On (Max) @ Id, Vgs102 mOhm @ 5A, 10V
Vgs(th) (Max) @ Id4V @ 1mA
Gate Charge (Qg) @ Vgs12.2nC @ 10V
Input Capacitance (Ciss) @ Vds779pF @ 25V
Power - Max60W
Operating Temperature-55°C ~ 175°C (TJ)
Mounting TypeSurface Mount
Package / CaseSC-100, SOT-669, 4-LFPAK
Supplier Device PackageLFPAK, Power-SO8
Standard Package 1,500
Weight0.001 KG
ApplicationEmail for details
Replacement PartBUK7Y102-100B,115
Country of OriginUSA / JAPAN / Philippines / Malaysia
MOQ1 Piece
Picture / Image / PhotoSend via email

BUK7Y102-100B,115 is in stock for immediate shipping now. We are the distributor of NXP Semiconductors all series components. The condition of BUK7Y102-100B,115 is new and unused, you can buy BUK7Y102-100B,115 NXP Semiconductors with us at a very low price and quick delivery.

Please kindly send us an email if you have any demands for BUK7Y102-100B,115.

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