| Manufacturer Part Number: | CD4011UBMT |
|---|---|
| Manufacturer: | T-I |
| Product Category: | Logic - Gates and Inverters |
| Available Quantity: | 9010 Pieces |
| Unit Price: | Quote by Email |
| Description: | NAND Gate IC 4 Channel 14-SOIC |
| Lead Free Status / RoHS Status: | Lead free / RoHS Compliant |
| Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
| Production Status (Lifecycle): | In Production |
| Delivery Time: | 1-2 Days |
| Date Code (D/C): | New |
| Datasheet Download: | CD4011UBMT Datasheet |
| Internal Part Number | 898-CD4011UBMT | |
| Manufacturer Lead time | 6-8 weeks | |
| Condition | New & Unused, Original Sealed | |
| EDA / CAD Models | Download from Accelerated Designs | |
| Online Catalog | 4000B - Texas Instruments | |
| Category | Integrated Circuits (ICs) | |
| Family | Logic - Gates and Inverters | |
| Manufacturer | T I | |
| Series | 4000B | |
| Packaging | Tape & Reel (TR) | |
| Part Status | Active | |
| Logic Type | NAND Gate | |
| Number of Circuits | 4 | |
| Number of Inputs | 2 | |
| Features | - | |
| Voltage - Supply | 3 V ~ 18 V | |
| Current - Quiescent (Max) | 1µA | |
| Current - Output High, Low | 3.4mA, 3.4mA | |
| Logic Level - Low | 1 V ~ 2.5 V | |
| Logic Level - High | 4 V ~ 12.5 V | |
| Max Propagation Delay @ V, Max CL | 50ns @ 15V, 50pF | |
| Operating Temperature | -55°C ~ 125°C | |
| Mounting Type | Surface Mount | |
| Supplier Device Package | 14-SOIC | |
| Package / Case | 14-SOIC (0.154", 3.90mm Width) | |
| Standard Package | 250 | |
| Weight | 0.001 KG | |
| Application | Email for details | |
| Replacement Part | CD4011UBMT | |
| Country of Origin | USA / JAPAN / Philippines / Malaysia | |
| MOQ | 1 Piece | |
| Picture / Image / Photo | Send via email | |
CD4011UBMT is in stock for immediate shipping now. We are the distributor of T-I all series components. The condition of CD4011UBMT is new and unused, you can buy CD4011UBMT T-I with us at a very low price and quick delivery.
Please kindly send us an email if you have any demands for CD4011UBMT.
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