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| Manufacturer Part Number: | FQP19N20L |
|---|---|
| Manufacturer: | Fairchild Semiconductor |
| Product Category: | Transistors - FETs, MOSFETs - Single |
| Available Quantity: | 9010 Pieces |
| Unit Price: | Quote by Email |
| Description: | MOSFET N-CH 200V 21A TO-220 |
| Lead Free Status / RoHS Status: | Lead free / RoHS Compliant |
| Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
| Production Status (Lifecycle): | Obsolete / Discontinued |
| Delivery Time: | 1-2 Days |
| Date Code (D/C): | New |
| Datasheet Download: | FQP19N20L Datasheet |
| Internal Part Number | 898-FQP19N20L | |
| Manufacturer Lead time | 6-8 weeks | |
| Condition | New & Unused, Original Sealed | |
| Category | Discrete Semiconductor Products | |
| Family | Transistors - FETs, MOSFETs - Single | |
| Manufacturer | Fairchild Semiconductor | |
| Series | QFET® | |
| Packaging | Tube | |
| Part Status | Obsolete | |
| FET Type | MOSFET N-Channel, Metal Oxide | |
| FET Feature | Logic Level Gate | |
| Drain to Source Voltage (Vdss) | 200V | |
| Current - Continuous Drain (Id) @ 25°C | 21A (Tc) | |
| Rds On (Max) @ Id, Vgs | 140 mOhm @ 10.5A, 10V | |
| Vgs(th) (Max) @ Id | 2V @ 250µA | |
| Gate Charge (Qg) @ Vgs | 35nC @ 5V | |
| Input Capacitance (Ciss) @ Vds | 2200pF @ 25V | |
| Power - Max | 140W | |
| Operating Temperature | -55°C ~ 150°C (TJ) | |
| Mounting Type | Through Hole | |
| Package / Case | TO-220-3 | |
| Supplier Device Package | TO-220-3 | |
| Standard Package | 1,000 | |
| Weight | 0.001 KG | |
| Application | Email for details | |
| Replacement Part | FQP19N20L | |
| Country of Origin | USA / JAPAN / Philippines / Malaysia | |
| MOQ | 1 Piece | |
| Picture / Image / Photo | Send via email | |
FQP19N20L is in stock for immediate shipping now. We are the distributor of Fairchild Semiconductor all series components. The condition of FQP19N20L is new and unused, you can buy FQP19N20L Fairchild Semiconductor with us at a very low price and quick delivery.
Please kindly send us an email if you have any demands for FQP19N20L.
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