Manufacturer Part Number: | HEF4021BP,652 |
---|---|
Manufacturer: | NXP Semiconductors |
Product Category: | Logic - Shift Registers |
Available Quantity: | 9010 Pieces |
Unit Price: | Quote by Email |
Description: | IC REGISTER STATIC 8BIT 16-DIP |
Lead Free Status / RoHS Status: | Lead free / RoHS Compliant |
Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
Production Status (Lifecycle): | Obsolete / Discontinued |
Delivery Time: | 1-2 Days |
Date Code (D/C): | New |
Datasheet Download: | HEF4021BP,652 Datasheet |
Internal Part Number | 898-HEF4021BP,652 | |
Manufacturer Lead time | 6-8 weeks | |
Condition | New & Unused, Original Sealed | |
Product Training Modules | Logic Packages | |
PCN Obsolescence/ EOL | Multiple Devices 29/Dec/2014 | |
PCN Assembly/Origin | PM45 from ICN6 to ICN8 13/Jul/2013 | |
PCN Packaging | Date Code Extended 18/Jul/2013 | |
EDA / CAD Models | Download from Accelerated Designs | |
Category | Integrated Circuits (ICs) | |
Family | Logic - Shift Registers | |
Manufacturer | NXP Semiconductors | |
Series | 4000B | |
Packaging | Tube | |
Part Status | Obsolete | |
Logic Type | Shift Register | |
Output Type | Push-Pull | |
Number of Elements | 1 | |
Number of Bits per Element | 8 | |
Function | Parallel or Serial to Serial | |
Voltage - Supply | 3 V ~ 15 V | |
Operating Temperature | -40°C ~ 125°C | |
Mounting Type | Through Hole | |
Package / Case | 16-DIP (0.300", 7.62mm) | |
Supplier Device Package | 16-DIP | |
Standard Package | 25 | |
Weight | 0.001 KG | |
Application | Email for details | |
Replacement Part | HEF4021BP,652 | |
Country of Origin | USA / JAPAN / Philippines / Malaysia | |
MOQ | 1 Piece | |
Picture / Image / Photo | Send via email |
HEF4021BP,652 is in stock for immediate shipping now. We are the distributor of NXP Semiconductors all series components. The condition of HEF4021BP,652 is new and unused, you can buy HEF4021BP,652 NXP Semiconductors with us at a very low price and quick delivery.
Please kindly send us an email if you have any demands for HEF4021BP,652.
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